ICSPI - Redux AFM

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AUSTRALIA

Benoit Fissot, General Manager, Technology, Australia & New Zealand

Phone 1800 010 114 (hotline)

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DKSH Australia Pty Ltd
1 Beyer Road
3195 Braeside VIC
Australia

INDONESIA

Noor Emma Sophianie, General Manager

Phone +62 21 2988 8557

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PT DKSH Indonesia
12930 Jakarta Selatan
Indonesia

MALAYSIA

Jasmine Keller, Assistant General Manager, Scientific Instrumentation

Phone +60 3 7882 8711

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DKSH Technology Sdn. Bhd.
B-11-01, The Ascent, Paradigm, No. 1, Jalan SS7/26A, Kelana Jaya
47301 Petaling Jaya, Selangor
Malaysia

NEW ZEALAND

Benoit Fissot, General Manager, Technology, Australia & New Zealand

Phone 0800 951 010

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DKSH New Zealand Limited
33 Westpoint Drive
0618 Hobsonville, Auckland
New Zealand

PHILIPPINES

Camilo Umlas, General Manager

Phone +63 2 8548 3200

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DKSH Philippines Inc.
8th Floor Cyber Sigma, Lawton Ave., McKinley West, Fort Bonifacio
1634 Taguig City
Philippines

SINGAPORE

Robert Puschmann, Vice President, Business Unit Technology, Singapore, Malaysia, and Vietnam, Digital and Operational Excellence

Phone +65 6471 1466

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DKSH Singapore Pte Ltd
625 Lorong 4 Toa Payoh, #03-00
319519 Singapore
Singapore

TAIWAN

Whitney Lin, Manager

Phone +886 2 8752 7935

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DKSH Taiwan Ltd.
10th Floor, No.22, Lane 407, Section 2, Tiding Boulevard, Neihu District
114-93 Taipei
Taiwan

THAILAND

Oliver Hammel, Vice President

Phone +66 2 639 7000

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DKSH Technology Limited (Head Office)
2533 Sukhumvit Road, Bangchak, Phrakhanong
10260 Bangkok
Thailand

VIETNAM

Nguyen Thi Xuan Mai, Senior Manager, National Sales

Phone +84 28 3812 5806 ext 89604

Fax +84 8 3812 5807

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DKSH Technology
5th Floor, Viettel Complex, 285 Cach Mang Thang Tam Ward 12, District 10/6th Floor, Peakview Tower, 36 Hoang Cau O Cho Dua Ward
70000 Ho Chi Minh City / Dong Da District, Ha Noi
Vietnam

Redux AFM Brochure 2024 - Protected
(PDF, 6 MB)

Effortlessly collect 3D topography data with sub-nanometer precision on your benchtop with the Redux AFM. Get quantitative data in minutes for topography, roughness, film thickness, particle size and more.

Precise: Quantitative 3D data with sub-nanometer precision
Automated: Motorized X, Y and Z stages for easy sample navigation
High throughput: Go from sample loading to data in minutes
Versatile: Topography, roughness, thickness, particle size and more

Revolutionary AFM-on-a-Chip Technology Simplifies Traditional AFM Processes

Traditional AFM instruments, while powerful for nanoscale surface imaging, are often hindered by complex and time-consuming setup processes rooted in technology developed in the 1980s. Recognizing this challenge, ICSPI revolutionized the landscape with its unique AFM-on-a-chip technology. The Redux AFM, harnessing this breakthrough technology, makes nanoscale imaging effortless. By integrating multiple components onto a single chip, the Redux eliminates the cumbersome aspects of traditional AFM, such as silicon probe exchange, cantilever alignment, tip crashes, tip-sample approach, and controller tuning.

AFM Specifications
Sensing	Self-sensing, laser alignment-free
Z actuation	Self-actuating
XY actuation	Electrothermal
Max scan area (XY)	20 μm x 20 μm
Z Range	20 μm
Sample
Max sample height	20 mm
Max sample weight	250 g
Integrated Optical Microscope
Objective	10x, 0.25 NA
Field of view	1.4 mm × 0.8 mm
Resolution	1920 x 1080 FHD video output
System Dimensions
Dimensions (L x W x H)	23.2 cm × 22.0 cm × 24.6 cm
Weight	4 kg
Software and I/O
Communication	USB
Operating System	Windows 10, 11
Power
Power supply	Class II (two prong)
Input	100-240 VAC ~ 50/60 Hz
Output	12 VDC, 3 A

ICSPI develops and produces easy to use and affordable benchtop AFM instruments designed for the individual scientist and individual lab to capture 3D images at the nanoscale. Incorporating our AFM-on-a-Chip technology, our flagship instrument, the nGauge AFM provides researchers and scientists 3D scans at the nanoscale in about a minute in their own lab and on their own bench. ICSPI is headquartered in Kitchener-Waterloo, Ontario, Canada.