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Helmut Fischer – Fischerscope X-ray XDL and XDLM

PHILIPPINES

Camilo Umlas, General Manager

+63 2 8548 3200
Contact Email
DKSH Philippines Inc.
8th Floor Cyber Sigma, Lawton Ave., McKinley West, Fort Bonifacio
1634 Taguig City
Philippines

Your Entry to the World of Automated XRF-Measurement

The FISCHERSCOPE® X-RAY XDL® and XDLM® X-ray fluorescence (XRF) spectrometers are closely related to the XUL series. All the main components – such as the detector, X-ray tubes and filter combinations – are identical. But there is a significant difference: The XDL and XDLM devices measure from top to bottom. And that means convenient XRF analysis of non-flat samples – complex shapes are no longer a problem!

Applications

  • Electroplated, galvanized coatings such as zinc on iron as corrosion protection
  • Serial testing of mass-produced parts
  • Analysis of the composition of special steels, e.g. detection of molybdenum in A4
  • Decorative chrome coatings, e.g. Cr/Ni/Cu/ABS
  • All typical chrome coatings – also new ones such as CrVI
  • Measurement of functional gold coatings on printed circuit boards such as Au/Ni/Cu/PCB or Sn/Cu/PCB
  • Coatings on connectors and contacts in the electronics industry such as Au/Ni/Cu and Sn/Ni/Cu

Key Features

  • Energy dispersive X-ray fluorescence (XRF) spectrometer for automated material analysis and non-destructive measurement of coating thickness according to ISO 3497 and ASTM B 568
  • Smallest measuring spot XDLM: approx. 0.1 mm; smallest measuring spot XDL: approx. 0.2 mm
  • Tungsten X-ray tube or tungsten microfocus tube (XDLM) as an x-ray source
  • Proven proportional counter tube detectors for fast measurement
  • Fixed or changeable collimators
  • Fixed or automatically exchangeable primary filters
  • Available with either a manual or a programmable XY stage
  • Slotted housing for measuring on large, printed circuit boards
  • Video camera for easy fixing of the measurement location
  • Patented by Fischer: the DCM method for simple and fast adjustment of the measuring distance
  • Certified full-protection devices 

With DCM: Easy Measurement of Complex Shaped Samples | X-RAY XDL 230 | Fischer

The FISCHERSCOPE® X-RAY XDL® 230 is an X-ray fluorescence measuring instrument for simple, fast coating thickness measurement. Perfectly suited for the measurement of single or multiple coatings.

Programmable, Motor-Driven XY-Stage for Automated Measurements | X-RAY XDLM 237 | Fischer

Save time and let the FISCHERSCOPE® X-RAY XDLM® 237 work for you! With the programmable XY-table, your Fischer X-RAY instrument performs measurements fully automatically.

Helmut Fischer

Fischer is a leading specialist in material analysis, coating thickness measurement and material testing since 1953. We offer a wide range of measuring devices for different industries: from simple handheld devices for quick testing on the go to fully integrated, high-end systems that automatically monitor your production.

In the 1980s and 90s, Fischer greatly expanded its product range. In addition to a hardness tester, the first X-ray fluorescence (XRF) instrument was launched in 1981. Numerous patented innovations helped the devices to quickly establish themselves in industrial use – because customers appreciate the reliability and measuring precision of Fischer instruments.

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