ICSPI - Redux AFM

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Camilo Umlas, General Manager

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DKSH Philippines Inc.
8th Floor Cyber Sigma, Lawton Ave., McKinley West, Fort Bonifacio
1634 Taguig City
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DKSH Australia Pty Ltd
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DKSH Technology Sdn. Bhd.
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DKSH Singapore Pte Ltd
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DKSH Technology
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Redux AFM Brochure 2024 - Protected
(PDF, 6 MB)

Effortlessly collect 3D topography data with sub-nanometer precision on your benchtop with the Redux AFM. Get quantitative data in minutes for topography, roughness, film thickness, particle size and more.

Precise: Quantitative 3D data with sub-nanometer precision
Automated: Motorized X, Y and Z stages for easy sample navigation
High throughput: Go from sample loading to data in minutes
Versatile: Topography, roughness, thickness, particle size and more

Revolutionary AFM-on-a-Chip Technology Simplifies Traditional AFM Processes

Traditional AFM instruments, while powerful for nanoscale surface imaging, are often hindered by complex and time-consuming setup processes rooted in technology developed in the 1980s. Recognizing this challenge, ICSPI revolutionized the landscape with its unique AFM-on-a-chip technology. The Redux AFM, harnessing this breakthrough technology, makes nanoscale imaging effortless. By integrating multiple components onto a single chip, the Redux eliminates the cumbersome aspects of traditional AFM, such as silicon probe exchange, cantilever alignment, tip crashes, tip-sample approach, and controller tuning.

AFM Specifications
Sensing	Self-sensing, laser alignment-free
Z actuation	Self-actuating
XY actuation	Electrothermal
Max scan area (XY)	20 μm x 20 μm
Z Range	20 μm
Sample
Max sample height	20 mm
Max sample weight	250 g
Integrated Optical Microscope
Objective	10x, 0.25 NA
Field of view	1.4 mm × 0.8 mm
Resolution	1920 x 1080 FHD video output
System Dimensions
Dimensions (L x W x H)	23.2 cm × 22.0 cm × 24.6 cm
Weight	4 kg
Software and I/O
Communication	USB
Operating System	Windows 10, 11
Power
Power supply	Class II (two prong)
Input	100-240 VAC ~ 50/60 Hz
Output	12 VDC, 3 A

ICSPI develops and produces easy to use and affordable benchtop AFM instruments designed for the individual scientist and individual lab to capture 3D images at the nanoscale. Incorporating our AFM-on-a-Chip technology, our flagship instrument, the nGauge AFM provides researchers and scientists 3D scans at the nanoscale in about a minute in their own lab and on their own bench. ICSPI is headquartered in Kitchener-Waterloo, Ontario, Canada.